Abrasion of Graphene-Enhanced Thermal Interface Materials for Electronics Thermal Management Applications
Paper i proceeding, 2024

Recent advances in materials science have shown that solid-state thermal interface materials (TIM) enhanced with graphene are becoming a viable substitute to thermal pastes and phase change materials (PCM) in electronics packaging with high power densities. Such graphene-enhanced TIM (GT-TIM) can ex-hibit comparable or lower thermal impedance than their thermal pastes and PCM counterparts, yet do not degrade under high heat flux. This makes them interesting for several applications, especially data centers and cloud computing. However, graphene has very high electric conductivity, thus increasing the risk of short circuits due to the release of graphene particle residues during handling, installation, or repeated use. Before becoming a viable alternative to high-power electronics in the industrial sector, the problem of potential short-circuiting must be resolved. In this paper, we investigated the release of particle residues from untreated and surface-coated GT-TIM by employing a unique abrasion method in which samples were abraded at a constant rate with constant applied pressure. The results show that the amount of particle residues released from the GT-TIM correlates to the pressure used for the TIM assembly and that surface coatings can significantly reduce the release of abraded particles at applied pressures at 12 kPa or lower. This work provides an insight into design considerations for a bonding/assembly/packaging process of the unique GT-TIM, enabling findings of optimum design and packaging conditions of using them for addressing the high-performance dissipation of novel and large power electronics systems.

thermal management

thermal interface material

graphene

electronics packaging

particle residue

abrasion

Författare

Kristoffer Harr Martinsen

SHT Smart High-Tech

Markus Enmark

Chalmers, Mikroteknologi och nanovetenskap, Elektronikmaterial

Yuanyuan Wang

SHT Smart High-Tech

Johan Moller

SHT Smart High-Tech

Johan Liu

Chalmers, Mikroteknologi och nanovetenskap, Elektronikmaterial

2024 IEEE 10th Electronics System-Integration Technology Conference, ESTC 2024 - Proceedings


9798350390360 (ISBN)

10th IEEE Electronics System-Integration Technology Conference, ESTC 2024
Berlin, Germany,

Grafenförbättrad nedsäkningskylning i datacenter tillämpningar

VINNOVA (2022-03831), 2023-03-01 -- 2024-08-31.

Ämneskategorier

Energiteknik

DOI

10.1109/ESTC60143.2024.10712058

Mer information

Senast uppdaterat

2024-11-14