Measurement of Reconfigurable Intelligent Surfaces Through the Back-Scattering Method: Demonstration at 28 GHz
Paper i proceeding, 2025

This paper introduces a parameter extraction technique for characterizing and validating the performance of a Reconfigurable Intelligent Surface (RIS) unit cells (UCs) using an over-the-air back-scattering approach. This technique addresses the challenge of characterizing RIS UCs when physical access to ports is not available. Experiments were conducted at 28 GHz with a prototype featuring two RIS UCs. The results demonstrate that the UC port relfection coefficient as seen from the load termination can be estimated by measuring the back-scattered field from the RIS. The accuracy of the estimation depends on the precision of the equivalent circuit models used for the reconfigurable PIN and varactor diodes employed as variable load terminations in the UCs. This method offers a practical solution for characterizing RIS UCs that may have highly integrated components so that over-the-air characterization becomes a necessity.

antenna measurement

over-the-air testing

Reconfigurable intelligent surface

backscattering method

Författare

Iaroslav Shilinkov

Chalmers, Elektroteknik, Kommunikation, Antenner och Optiska Nätverk

Oleg Iupikov

Chalmers, Elektroteknik, Kommunikation, Antenner och Optiska Nätverk

Pavlo Krasov

Chalmers, Elektroteknik, Kommunikation, Antenner och Optiska Nätverk

Yuqing Zhu

Chalmers, Elektroteknik, Kommunikation, Antenner och Optiska Nätverk

Rob Maaskant

Chalmers, Elektroteknik, Kommunikation, Antenner och Optiska Nätverk

Marianna Ivashina

Chalmers, Elektroteknik, Kommunikation, Antenner och Optiska Nätverk

Eucap 2025 19th European Conference on Antennas and Propagation


9788831299107 (ISBN)

19th European Conference on Antennas and Propagation, EuCAP 2025
Stockholm, Sweden,

Ämneskategorier (SSIF 2025)

Kommunikationssystem

Telekommunikation

Signalbehandling

DOI

10.23919/EuCAP63536.2025.10999375

Mer information

Senast uppdaterat

2025-06-18