A new method of determining the effective channel width and its dependence on the gate voltage
Paper i proceeding, 1996
A novel and simple method for the extraction of the effective channel width and its dependence on the gate voltage is presented. Both synthetic and measured data have been used to evaluate the new method which is superior to previous methods in not assuming any particular width or gate voltage dependencies of the series resistance.
Electrical resistance measurement
Geometry
Robustness
Solid state circuits
Data mining
Performance evaluation
Particle measurements
Integrated circuit measurements
Voltage
Fluctuations
Författare
Peter R. Karlsson
Institutionen för fasta tillståndets elektronik
Kjell Jeppson
Institutionen för mikroelektronik och nanovetenskap
Institutionen för fasta tillståndets elektronik
Anders Bogren
Institutionen för fasta tillståndets elektronik
Proceedings of the IEEE International Conference on Microelectronic Test Structures ICMTS
Vol. 1996 25-28 March 1996
0-7803-2783-7 (ISBN)
Ämneskategorier
Elektroteknik och elektronik
DOI
10.1109/ICMTS.1996.535637