Reliability analysis of embedded chip technique with design of experiment methods
Paper in proceeding, 2005
Author
Xiuzhen Lu
Liu Chen
Chalmers, Microtechnology and Nanoscience (MC2), Solid State Electronics
Zhaonian Cheng
Johan Liu
Chalmers, Microtechnology and Nanoscience (MC2), Solid State Electronics
2005 International Symposium on Electronics Materials and Packaging
pp43-49
Subject Categories
Electrical Engineering, Electronic Engineering, Information Engineering