Reliability analysis of embedded chip technique with design of experiment methods
Paper in proceedings, 2005

Author

Xiuzhen Lu

Liu Chen

Chalmers, Microtechnology and Nanoscience (MC2), Solid State Electronics

Zhaonian Cheng

Johan Liu

Chalmers, Microtechnology and Nanoscience (MC2), Solid State Electronics

2005 International Symposium on Electronics Materials and Packaging

pp43-49

Subject Categories

Electrical Engineering, Electronic Engineering, Information Engineering

More information

Created

10/8/2017