Quantitative APT analysis of Ti(C,N)
Journal article, 2011
Author
Jenny Angseryd
Chalmers, Applied Physics, Microscopy and Microanalysis
Fang Liu
Chalmers, Applied Physics, Microscopy and Microanalysis
Hans-Olof Andrén
Chalmers, Applied Physics, Microscopy and Microanalysis
Stephan S A Gerstl
Imago Scientific Instruments
Mattias Thuvander
Chalmers, Applied Physics, Microscopy and Microanalysis
Ultramicroscopy
0304-3991 (ISSN) 1879-2723 (eISSN)
Vol. 111 6 609-614Subject Categories
Analytical Chemistry
Manufacturing, Surface and Joining Technology
Areas of Advance
Materials Science
DOI
10.1016/j.ultramic.2011.01.031