Influence of thin GaAs and AlAs cap layers on the structural properties of InAs quantum dots grown by molecular beam epitaxy
Paper in proceeding, 2002
molecular beam epitaxial growth
gallium arsenide
semiconductor quantum dots
indium compounds
atomic force microscopy
aluminium compounds
III-V semiconductors
semiconductor growth
Author
Fariba Ferdos
Department of Microelectronics
Shu Min Wang
Department of Microelectronics
Yongqiang Wei
Department of Microelectronics
Anders Larsson
Department of Microelectronics
Mahdad Sadeghi
Department of Microelectronics and Nanoscience
Qing Xiang Zhao
Chalmers, Physical Electronics and Photonics
International Conference on Molecular Beam Epitaxy, 2002
285-6
Subject Categories
Telecommunications
Condensed Matter Physics
DOI
10.1109/MBE.2002.1037871