Analysis of liposome model systems by time-of-flight secondary ion mass spectrometry
Journal article, 2014
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is an important technique for studying chemical composition of micrometer scale objects because of its high spatial resolution imaging capabilities and chemical specificity. In this work, we focus on the application of ToF-SIMS to gain insight into the chemistry of micrometer size liposomes as a potential model for neurotransmitter vesicles. Two models of giant liposomes were analyzed: histamine and aqueous two-phase system-containing liposomes. Characterization of the internal structure of single fixed liposomes was carried out both with the Bi-3(+) and C-60(+) ion sources. The depth profiling capability of ToF-SIMS was used to investigate the liposome interior.
aqueous two-phase system
ToF-SIMS
imaging
histamine
depth profile analysis
liposome
Author
Jelena Lovric
Chalmers, Chemical and Biological Engineering, Analytical Chemistry
Jacqueline Keighron
Chalmers, Chemical and Biological Engineering, Analytical Chemistry
Tina B. Angerer
University of Gothenburg
Li Xianchan
Chalmers, Chemical and Biological Engineering, Analytical Chemistry
Per Malmberg
Chalmers, Chemical and Biological Engineering, Analytical Chemistry
John Fletcher
University of Gothenburg
Andrew Ewing
University of Gothenburg
Chalmers, Chemical and Biological Engineering, Analytical Chemistry
Published in
Surface and Interface Analysis
0142-2421 (ISSN) 1096-9918 (eISSN)
Vol. 46 Issue S1 p. 74-78Categorizing
Subject Categories (SSIF 2011)
Chemical Engineering
Identifiers
DOI
10.1002/sia.5623