Analysis of liposome model systems by time-of-flight secondary ion mass spectrometry
Paper in proceedings, 2014

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is an important technique for studying chemical composition of micrometer scale objects because of its high spatial resolution imaging capabilities and chemical specificity. In this work, we focus on the application of ToF-SIMS to gain insight into the chemistry of micrometer size liposomes as a potential model for neurotransmitter vesicles. Two models of giant liposomes were analyzed: histamine and aqueous two-phase system-containing liposomes. Characterization of the internal structure of single fixed liposomes was carried out both with the Bi-3(+) and C-60(+) ion sources. The depth profiling capability of ToF-SIMS was used to investigate the liposome interior.

liposome

imaging

histamine

ToF-SIMS

aqueous two-phase system

depth profile analysis

Author

Jelena Lovric

Chalmers, Chemical and Biological Engineering, Analytical Chemistry

Jacqueline Keighron

Chalmers, Chemical and Biological Engineering, Analytical Chemistry

Tina B. Angerer

University of Gothenburg

Li Xianchan

Chalmers, Chemical and Biological Engineering, Analytical Chemistry

Per Malmberg

Chalmers, Chemical and Biological Engineering, Analytical Chemistry

John Fletcher

University of Gothenburg

Andrew Ewing

University of Gothenburg

Chalmers, Chemical and Biological Engineering, Analytical Chemistry

Surface and Interface Analysis

0142-2421 (ISSN) 1096-9918 (eISSN)

Vol. 46 S1 74-78

Subject Categories

Chemical Engineering

DOI

10.1002/sia.5623

More information

Created

10/7/2017