Analysis of liposome model systems by time-of-flight secondary ion mass spectrometry
Paper i proceeding, 2014

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is an important technique for studying chemical composition of micrometer scale objects because of its high spatial resolution imaging capabilities and chemical specificity. In this work, we focus on the application of ToF-SIMS to gain insight into the chemistry of micrometer size liposomes as a potential model for neurotransmitter vesicles. Two models of giant liposomes were analyzed: histamine and aqueous two-phase system-containing liposomes. Characterization of the internal structure of single fixed liposomes was carried out both with the Bi-3(+) and C-60(+) ion sources. The depth profiling capability of ToF-SIMS was used to investigate the liposome interior.

liposome

imaging

histamine

ToF-SIMS

aqueous two-phase system

depth profile analysis

Författare

Jelena Lovric

Chalmers, Kemi- och bioteknik, Analytisk kemi

Jacqueline Keighron

Chalmers, Kemi- och bioteknik, Analytisk kemi

Tina B. Angerer

Göteborgs universitet

Li Xianchan

Chalmers, Kemi- och bioteknik, Analytisk kemi

Per Malmberg

Chalmers, Kemi- och bioteknik, Analytisk kemi

John Fletcher

Göteborgs universitet

Andrew Ewing

Göteborgs universitet

Chalmers, Kemi- och bioteknik, Analytisk kemi

Surface and Interface Analysis

0142-2421 (ISSN) 1096-9918 (eISSN)

Vol. 46 S1 74-78

Ämneskategorier

Kemiteknik

DOI

10.1002/sia.5623

Mer information

Skapat

2017-10-07