Analysis of liposome model systems by time-of-flight secondary ion mass spectrometry
Artikel i vetenskaplig tidskrift, 2014
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is an important technique for studying chemical composition of micrometer scale objects because of its high spatial resolution imaging capabilities and chemical specificity. In this work, we focus on the application of ToF-SIMS to gain insight into the chemistry of micrometer size liposomes as a potential model for neurotransmitter vesicles. Two models of giant liposomes were analyzed: histamine and aqueous two-phase system-containing liposomes. Characterization of the internal structure of single fixed liposomes was carried out both with the Bi-3(+) and C-60(+) ion sources. The depth profiling capability of ToF-SIMS was used to investigate the liposome interior.
aqueous two-phase system
ToF-SIMS
imaging
histamine
depth profile analysis
liposome
Författare
Jelena Lovric
Chalmers, Kemi- och bioteknik, Analytisk kemi
Jacqueline Keighron
Chalmers, Kemi- och bioteknik, Analytisk kemi
Tina B. Angerer
Göteborgs universitet
Li Xianchan
Chalmers, Kemi- och bioteknik, Analytisk kemi
Per Malmberg
Chalmers, Kemi- och bioteknik, Analytisk kemi
John Fletcher
Göteborgs universitet
Andrew Ewing
Göteborgs universitet
Chalmers, Kemi- och bioteknik, Analytisk kemi
Surface and Interface Analysis
0142-2421 (ISSN) 1096-9918 (eISSN)
Vol. 46 S1 74-78Ämneskategorier
Kemiteknik
DOI
10.1002/sia.5623