On Skin Effect in On-Chip Interconnects
Paper in proceedings, 2004

We investigate the influence of skin effect on the propagation delays of on-chip interconnects. For long wires, designed in the LC regime, on the top metal layer in a contemporary process, we find that the skin effect causes an extra delay by 10%. The impact of the skin effect on delay is furthermore rapidly increasing with increased interconnect width.

Author

Daniel Andersson

Chalmers, Department of Computer Engineering, Integrated Electronic Systems

Lars Svensson

Chalmers, Department of Computer Engineering, Integrated Electronic Systems

Per Larsson-Edefors

Chalmers, Department of Computer Engineering, Integrated Electronic Systems

Intl Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS)

463-470

Subject Categories

Computer and Information Science

DOI

10.1007/978-3-540-30205-6_48

More information

Created

10/8/2017