Effect of Curing Condition of Adhesion Strength and ACA Flip Chip Contact Resistance
Paper in proceeding, 2004
Author
Liqiang Cao
Zonghe Lai
Chalmers, Microtechnology and Nanoscience (MC2), Solid State Electronics
Johan Liu
Chalmers, Microtechnology and Nanoscience (MC2), Solid State Electronics
Proceedings of The 6th IEEE CPMT International Symposium on High Density Packaging and Component Failure Anlaysis (HDP'4)
Vol. 04 EX905 pp 254-258
Subject Categories
Electrical Engineering, Electronic Engineering, Information Engineering