Enhancing Temporal Logic Falsification with Specification Transformation and Valued Booleans
Journal article, 2020
Test generation
Testing
Embedded systems
Simulation
Author
Johan Lidén Eddeland
Volvo Cars
Chalmers, Electrical Engineering, Systems and control
Koen Claessen
Chalmers, Computer Science and Engineering (Chalmers), Functional Programming
Nicholas Smallbone
Chalmers, Computer Science and Engineering (Chalmers), Functional Programming
Zahra Ramezani
Chalmers, Electrical Engineering, Systems and control
Sajed Miremadi
Volvo Cars
Knut Åkesson
Chalmers, Electrical Engineering, Systems and control
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
0278-0070 (ISSN) 19374151 (eISSN)
Vol. 39 12 5247-5260 8957695Model Based Testing of Mechatronic Systems (TESTRON)
VINNOVA (2015-04893), 2016-01-01 -- 2019-12-31.
Systematic testing of cyber-physical systems (SyTeC)
Swedish Research Council (VR) (2016-06204), 2017-01-01 -- 2022-12-31.
Subject Categories
Embedded Systems
Computer Science
Other Electrical Engineering, Electronic Engineering, Information Engineering
DOI
10.1109/TCAD.2020.2966480