Comparison Between Artificial and in-Service Impulse Electrical Stress for Insulation Degradation Tests
Paper in proceeding, 2025
Author
Thomas Hammarström
Chalmers, Electrical Engineering, Electric Power Engineering
Yuriy Serdyuk
Chalmers, Electrical Engineering, Electric Power Engineering
Stanislaw Gubanski
Chalmers, Electrical Engineering, Electric Power Engineering
Johan Tidholm
SEM AB
Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
00849162 (ISSN)
464-4679798331589028 (ISBN)
Manchester, United Kingdom,
Subject Categories (SSIF 2025)
Other Electrical Engineering, Electronic Engineering, Information Engineering
DOI
10.1109/CEIDP61707.2025.11218399