Thin foil analysis in the SEM
Journal article, 2008
Author
Mats Halvarsson
Chalmers, Applied Physics, Microscopy and Microanalysis
Torbjörn Jonsson
Chalmers, Applied Physics, Microscopy and Microanalysis
Sead Canovic
Chalmers, Applied Physics, Microscopy and Microanalysis
Journal of Physics: Conference Series
17426588 (ISSN) 17426596 (eISSN)
Vol. 126 4- 012075Subject Categories
Other Engineering and Technologies not elsewhere specified
DOI
10.1088/1742-6596/126/1/012075