RF Characterisation of Flip-Chip Aniostropic Conductive Adhesive Joints
Paper i proceeding, 2006
Författare
Xu Wang
Shanghai University
Zhaonian Cheng
Shanghai University
Johan Liu
Chalmers, Teknisk fysik, Elektronikmaterial
Shanghai University
Proceedings of the eight IEEE CPMT International Symposium on High Density Packaging and Component Failure Anlaysis (HDP´06), Shanghai, China
1-4244-0488-6 (ISBN)
Shanghai, China,
Ämneskategorier (SSIF 2011)
Annan elektroteknik och elektronik
DOI
10.1109/HDP.2006.1707595