X-ray photoelectron spectroscopy studies of indium tin oxide nanocrystalline powder
Artikel i vetenskaplig tidskrift, 2005

Indium tin oxide films and coatings are widely used and can be produced by different techniques including dip and spin-coating of suspensions of nano-particles. To achieve high quality films the nano-powder has to be fully characterized. Hence, three co-precipitated nanocrystalline indium tin oxide powders of different particle size were investigated by use of X-ray photoelectron spectroscopy. The analysis indicated that indium and tin are in oxide state, i.e. no metallic component could be observed. In addition, measurements by use of X-ray diffraction, scanning electron microscopy/energy dispersive X-ray spectroscopy and transmission electron microscopy were performed. They showed that indium tin oxide primary particles are slightly elliptical and facetted in shape, respectively. The powders have a body center cubic lattice type and the lattice parameter is 1.01 nm. Measured by both X-ray photoelectron spectroscopy and energy dispersive X-ray, the tin content was determined to be 5-6 at.%.

bulk chemical composition

XPS

ITO

nanocrystalline powder

depth profile

Författare

Bagas Pujilaksono

Chalmers, Kemi- och bioteknik, Oorganisk miljökemi

Chalmers, Material- och tillverkningsteknik, Yt- och mikrostrukturteknik

Uta Klement

Chalmers, Material- och tillverkningsteknik

Lars Nyborg

Chalmers, Material- och tillverkningsteknik

Chalmers, Kemi- och bioteknik, Oorganisk miljökemi

Urban Paul Einar Jelvestam

Chalmers, Material- och tillverkningsteknik

Sven Hill

Detlef Burgard

Materials Characterization

Vol. 54 1-7

Ämneskategorier

Materialteknik