Olle Axelsson
Showing 11 publications
Impact of Trapping Effects on the Recovery Time of GaN Based Low Noise
Application Relevant Evaluation of Trapping Effects in AlGaN/GaN HEMTs With Fe-Doped Buffer
The Effect of Forward Gate Bias Stress on the Noise Performance of Mesa Isolated GaN HEMTs
Noise temperature of an electronic tuner for noise parameter measurement systems
Highly linear gallium nitride MMIC LNAs
Design and characterization of a highly linear 3 GHz GaN HEMT amplifier
Fabrication and Characterization of Thin-Barrier Al05Ga05N/AlN/GaN HEMTs
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