Reliability Investigation for Encapsulated Isotropic Conductive Adhesives Flip Chip Interconnection
Journal article, 2005
Author
Liu Chen
Chalmers, Microtechnology and Nanoscience (MC2), Solid State Electronics
Zonghe Lai
Chalmers, Microtechnology and Nanoscience (MC2), Solid State Electronics
Zhaonian Cheng
Johan Liu
Chalmers, Microtechnology and Nanoscience (MC2), Solid State Electronics
Journal of Electronic Packaging
Vol. 3 pp343-349
Subject Categories
Electrical Engineering, Electronic Engineering, Information Engineering