Reliability Investigation for Encapsulated Isotropic Conductive Adhesives Flip Chip Interconnection
Journal article, 2005

Author

Liu Chen

Chalmers, Microtechnology and Nanoscience (MC2), Solid State Electronics

Zonghe Lai

Chalmers, Microtechnology and Nanoscience (MC2), Solid State Electronics

Zhaonian Cheng

Johan Liu

Chalmers, Microtechnology and Nanoscience (MC2), Solid State Electronics

Journal of Electronic Packaging

Vol. 3 pp343-349

Subject Categories

Electrical Engineering, Electronic Engineering, Information Engineering

More information

Created

10/8/2017