Estimation of mass thickness response of embedded aggregated silica nanospheres from high angle annular dark-field scanning transmission electron micrographs
Journal article, 2014
In this study, we investigate the functional behaviour of the intensity in high-angle annular dark field scanning transmission electron micrograph images. The model material is a silica particle (20 nm) gel at 5 wt%. By assuming that the intensity response is monotonically increasing with increasing mass thickness of silica, an estimate of the functional form is calculated using a maximum likelihood approach. We conclude that a linear functional form of the intensity provides a fair estimate but that a power function is significantly better for estimating the amount of silica in the z-direction. The work adds to the development of quantifying material properties from electron micrographs, especially in the field of tomography methods and three-dimensional quantitative structural characterization from a scanning transmission electron micrograph. It also provides means for direct three-dimensional quantitative structural characterization from a scanning transmission electron micrograph.
Likelihood
structural characterization
scanning transmission electron microscopy
mass thickness
TOMOGRAPHY
Author
Matias Nordin
Chalmers, Chemical and Biological Engineering, Applied Surface Chemistry
SuMo Biomaterials
Christoffer Abrahamsson
SuMo Biomaterials
Chalmers, Chemical and Biological Engineering, Applied Surface Chemistry
Charlotte Hamngren Blomqvist
Chalmers, Applied Physics, Eva Olsson Group
SuMo Biomaterials
Henrike Häbel
SuMo Biomaterials
University of Gothenburg
Chalmers, Mathematical Sciences, Mathematical Statistics
Magnus Röding
SuMo Biomaterials
University of Gothenburg
Chalmers, Mathematical Sciences, Mathematical Statistics
Eva Olsson
Chalmers, Applied Physics, Eva Olsson Group
Magnus Nydén
University of South Australia
Mats Rudemo
Chalmers, Mathematical Sciences, Mathematical Statistics
University of Gothenburg
Journal of Microscopy
0022-2720 (ISSN) 1365-2818 (eISSN)
Vol. 253 2 166-170Subject Categories
Physical Sciences
Areas of Advance
Materials Science
DOI
10.1111/jmi.12107