Estimation of mass thickness response of embedded aggregated silica nanospheres from high angle annular dark-field scanning transmission electron micrographs
Journal article, 2014

In this study, we investigate the functional behaviour of the intensity in high-angle annular dark field scanning transmission electron micrograph images. The model material is a silica particle (20 nm) gel at 5 wt%. By assuming that the intensity response is monotonically increasing with increasing mass thickness of silica, an estimate of the functional form is calculated using a maximum likelihood approach. We conclude that a linear functional form of the intensity provides a fair estimate but that a power function is significantly better for estimating the amount of silica in the z-direction. The work adds to the development of quantifying material properties from electron micrographs, especially in the field of tomography methods and three-dimensional quantitative structural characterization from a scanning transmission electron micrograph. It also provides means for direct three-dimensional quantitative structural characterization from a scanning transmission electron micrograph.

mass thickness

structural characterization

TOMOGRAPHY

scanning transmission electron microscopy

Likelihood

Author

Matias Nordin

SuMo Biomaterials

Chalmers, Chemical and Biological Engineering, Applied Surface Chemistry

Christoffer Abrahamsson

SuMo Biomaterials

Chalmers, Chemical and Biological Engineering, Applied Surface Chemistry

Charlotte Hamngren Blomqvist

Chalmers, Applied Physics, Eva Olsson Group

SuMo Biomaterials

Henrike Häbel

University of Gothenburg

SuMo Biomaterials

Chalmers, Mathematical Sciences, Mathematical Statistics

Magnus Röding

SuMo Biomaterials

University of Gothenburg

Chalmers, Mathematical Sciences, Mathematical Statistics

Eva Olsson

Chalmers, Applied Physics, Eva Olsson Group

Magnus Nydén

University of South Australia

Mats Rudemo

University of Gothenburg

Chalmers, Mathematical Sciences, Mathematical Statistics

Journal of Microscopy

0022-2720 (ISSN) 1365-2818 (eISSN)

Vol. 253 2 166-170

Subject Categories

Physical Sciences

Areas of Advance

Materials Science

DOI

10.1111/jmi.12107

More information

Created

10/7/2017