Test structures for studying flexible interconnect supported by carbon nanotube scaffolds
Paper in proceeding, 2017
Author
Kjell Jeppson
Chalmers, Microtechnology and Nanoscience (MC2), Electronics Material and Systems
Di Jiang
Chalmers, Microtechnology and Nanoscience (MC2), Electronics Material and Systems
Shuangxi Sun
Chalmers, Microtechnology and Nanoscience (MC2), Electronics Material and Systems
Michael Edwards
Chalmers, Microtechnology and Nanoscience (MC2), Electronics Material and Systems
IEEE International Conference on Microelectronic Test Structures
Vol. 2017
Subject Categories
Electrical Engineering, Electronic Engineering, Information Engineering
Nano Technology
DOI
10.1109/ICMTS.2017.7954256