Reliability assessment of GaAs and InP THz mixers and frequency multipliers fabricated on 3" wafers
Paper in proceedings, 2019

We report on the developments in this two-yearEuropean Space Agency funded project that aims at performing a preliminary reliability study of 300 GHz InP heterostructure barrier varactor diode multipliers and 1.2 THz GaAs Schottky diode mixers. Fabrication of the monolithically integrated circuits will be done on 3” wafers usingestablished III-V processing. The reliability tests that will be performed include thermal and electrical step-stress studies, as well as shock, humidity and accelerated lifetime tests. We will present results and analysis of these experiments.

Author

Josip Vukusic

Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory

Vladimir Drakinskiy

Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics

Daniel Heinerås

Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory

Divya Jayasankar

Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory

Peter Sobis

Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory

Tomas Bryllert

Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory

Vaclav Valenta

European Space Research and Technology Centre (ESA ESTEC)

Marie Geneviev

European Space Research and Technology Centre (ESA ESTEC)

Fernando Martinez Martin

European Space Research and Technology Centre (ESA ESTEC)

Jan Stake

Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory

International Symposium on Space Terahertz Technology

30th International Symposium on Space Terahertz Technology
Gothenburg, Sweden,

Areas of Advance

Information and Communication Technology

Infrastructure

Kollberg Laboratory

Nanofabrication Laboratory

Subject Categories

Electrical Engineering, Electronic Engineering, Information Engineering

More information

Latest update

7/30/2020