Hotspot test structures for evaluating carbon nanotube microfin coolers and graphene-like heat spreaders
Paper i proceeding, 2016

The design, fabrication, and use of a hotspot-producing and temperature-sensing test structure for evaluating the thermal properties of carbon nanotubes, graphene and boron nitride for cooling of electronic devices in applications like 3D integrated chip-stacks, power amplifiers and light-emitting diodes is described. The test structure is a simple meander-shaped metal resistor serving both as the hotspot and the temperature thermo-meter. By use of this test structure, the influence of emerging materials like those mentioned above on the temperature of the hotspot has been evaluated with good accuracy).

test structures

resistance temperature detectors

hotspots

graphene

heat spreaders

boron nitride

Författare

Kjell Jeppson

Chalmers, Mikroteknologi och nanovetenskap, Elektronikmaterial

Jie Bao

Chalmers, Mikroteknologi och nanovetenskap, Elektronikmaterial

Shanghai University

S. Huang

Chalmers, Mikroteknologi och nanovetenskap, Elektronikmaterial

Shanghai University

Yong Zhang

Chalmers, Mikroteknologi och nanovetenskap, Elektronikmaterial

Shuangxi Sun

Chalmers, Mikroteknologi och nanovetenskap, Elektronikmaterial

Yifeng Fu

Chalmers, Mikroteknologi och nanovetenskap, Elektronikmaterial

Johan Liu

Chalmers, Mikroteknologi och nanovetenskap, Elektronikmaterial

29th IEEE International Conference on Microelectronic Test Structures (ICMTS), Yokohama, Japan, Mar 28-31, 2016

1071-9032 (ISSN)

Vol. 2016-May 32-36

Pilot line production of functionalized CNTs as thermal interface material for heat dissipation in electronics applications (SMARTHERM)

Europeiska kommissionen (EU) (EC/H2020/690896), 2016-01-01 -- 2018-12-31.

Styrkeområden

Nanovetenskap och nanoteknik

Ämneskategorier

Elektroteknik och elektronik

DOI

10.1109/ICMTS.2016.7476169

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Senast uppdaterat

2024-07-12