Mechanical and thermal characterisaton of a novel nanocomposite thermal interface material for electronics packaging
Journal article, 2016
Author
Shuangxi Sun
Shanghai University
Chalmers, Microtechnology and Nanoscience (MC2), Electronics Material and Systems
Si Chen
Shanghai University
Chalmers, Microtechnology and Nanoscience (MC2), Electronics Material and Systems
Xin Luo
Chalmers, Microtechnology and Nanoscience (MC2), Electronics Material and Systems
Shanghai University
Yifeng Fu
SHT Smart High-Tech
Chalmers, Microtechnology and Nanoscience (MC2), Electronics Material and Systems
Ye Lilei
SHT Smart High-Tech
Johan Liu
Shanghai University
Chalmers, Microtechnology and Nanoscience (MC2), Electronics Material and Systems
Microelectronics and Reliability
0026-2714 (ISSN)
Vol. 56 129-135Areas of Advance
Nanoscience and Nanotechnology
Subject Categories (SSIF 2011)
Materials Engineering
DOI
10.1016/j.microrel.2015.10.028