Mechanical and thermal characterisaton of a novel nanocomposite thermal interface material for electronics packaging
Journal article, 2016

This paper presents a novel nanocomposite thermal interface material (Nano-TIM) consisting of a silver coated polyimide network and the indium matrix. One of the potential applications of this Nano-TIM is for heat dissipation in integrated circuits and electronic packaging. The shear strength of the Nano-TIM was investigated with DAGE-4000PSY shear tester. The shear strength of Nano-TIM is 4.5 MPa, which is 15% higher than that of the pure indium thermal interface material. The microstructure of cross-section and fracture surface was studied using Scanning Electron Microscopy (SEM). SEM pictures show a uniform polymer fiber distribution and solid interface between silver coated fibers and indium matrix. The thermal fatigue resistance of the Nano-TIM was evaluated by monitoring the variation of thermal interface resistance during the thermal cycling test (- 40 to 125 °C). The thermal interface resistance was measured with a commercial xenon flash instrument after 100, 200, 300, 400, 500, and 1000 temperature cycles. The results of thermal cycling test show that Nano-TIM presented consistent reliability performance with pure indium. Furthermore, the cooling effect of Nano-TIM was demonstrated through measuring the power chip temperature in the die attached structure by using an Infrared Camera. In the test, the Nano-TIM shows a comparable cooling effect to pure indium TIM for die attach applications in electronics packaging.

Author

Shuangxi Sun

Shanghai University

Chalmers, Microtechnology and Nanoscience (MC2), Electronics Material and Systems

Si Chen

Shanghai University

Chalmers, Microtechnology and Nanoscience (MC2), Electronics Material and Systems

Xin Luo

Chalmers, Microtechnology and Nanoscience (MC2), Electronics Material and Systems

Shanghai University

Yifeng Fu

SHT Smart High-Tech

Chalmers, Microtechnology and Nanoscience (MC2), Electronics Material and Systems

Ye Lilei

SHT Smart High-Tech

Johan Liu

Shanghai University

Chalmers, Microtechnology and Nanoscience (MC2), Electronics Material and Systems

Microelectronics and Reliability

0026-2714 (ISSN)

Vol. 56 129-135

Areas of Advance

Nanoscience and Nanotechnology

Subject Categories (SSIF 2011)

Materials Engineering

DOI

10.1016/j.microrel.2015.10.028

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Latest update

7/13/2026