Hotspot test structures for evaluating carbon nanotube microfin coolers and graphene-like heat spreaders
Paper in proceeding, 2016
test structures
resistance temperature detectors
hotspots
graphene
heat spreaders
boron nitride
Author
Kjell Jeppson
Chalmers, Microtechnology and Nanoscience (MC2), Electronics Material and Systems
Jie Bao
Chalmers, Microtechnology and Nanoscience (MC2), Electronics Material and Systems
Shanghai University
S. Huang
Chalmers, Microtechnology and Nanoscience (MC2), Electronics Material and Systems
Shanghai University
Yong Zhang
Chalmers, Microtechnology and Nanoscience (MC2), Electronics Material and Systems
Shuangxi Sun
Chalmers, Microtechnology and Nanoscience (MC2), Electronics Material and Systems
Yifeng Fu
Chalmers, Microtechnology and Nanoscience (MC2), Electronics Material and Systems
Johan Liu
Chalmers, Microtechnology and Nanoscience (MC2), Electronics Material and Systems
29th IEEE International Conference on Microelectronic Test Structures (ICMTS), Yokohama, Japan, Mar 28-31, 2016
1071-9032 (ISSN)
Vol. 2016-May 32-36Pilot line production of functionalized CNTs as thermal interface material for heat dissipation in electronics applications (SMARTHERM)
European Commission (EC) (EC/H2020/690896), 2016-01-01 -- 2018-12-31.
Areas of Advance
Nanoscience and Nanotechnology
Subject Categories
Electrical Engineering, Electronic Engineering, Information Engineering
DOI
10.1109/ICMTS.2016.7476169