Hotspot test structures for evaluating carbon nanotube microfin coolers and graphene-like heat spreaders
Paper i proceeding, 2016

The design, fabrication, and use of a hotspot-producing and temperature-sensing test structure for evaluating the thermal properties of carbon nanotubes, graphene and boron nitride for cooling of electronic devices in applications like 3D integrated chip-stacks, power amplifiers and light-emitting diodes is described. The test structure is a simple meander-shaped metal resistor serving both as the hotspot and the temperature thermo-meter. By use of this test structure, the influence of emerging materials like those mentioned above on the temperature of the hotspot has been evaluated with good accuracy).

hotspots

test structures

boron nitride

resistance temperature detectors

heat spreaders

graphene

Författare

Kjell Jeppson

Elektronikmaterial och system

Jie Bao

Shanghai University

Chalmers University of Technology

S. Huang

Chalmers University of Technology

Shanghai University

Yong Zhang

Elektronikmaterial och system

Shuangxi Sun

Elektronikmaterial och system

Yifeng Fu

Elektronikmaterial och system

Johan Liu

Elektronikmaterial och system

29th IEEE International Conference on Microelectronic Test Structures (ICMTS), Yokohama, Japan, Mar 28-31, 2016

1071-9032 (ISSN)

32-36

Carbon Based Smart Systems for Wireless Applications (NANO RF)

Europeiska kommissionen (FP7), 2012-09-01 -- 2015-08-31.

Styrkeområden

Nanovetenskap och nanoteknik

Ämneskategorier

Elektroteknik och elektronik

DOI

10.1109/ICMTS.2016.7476169

ISBN

978-1-4673-8791-0