Alok Ranjan

Dr. Alok Ranjan’s research focuses on advancing electron microscopy techniques for the characterization of advanced materials with the transmission electron microscopy (TEM), in situ and operando methodologies. The aim is to unravel nanoscale structure–property relationships and understand dynamic material behavior. A key focus of Dr. Ranjan’s research is the development of versatile experimental platforms for in situ electron microscopy, including customized microelectromechanical systems (MEMS) chips that enable the investigation of materials under controlled environments and external stimuli. This facilitates the study of material behavior under realistic operating conditions in both vacuum and liquid environments. By combining MEMS, electron microscopy, and materials science, his work investigates dynamic nanoscale processes in functional materials and devices. The MEMS platform is used to study a broad range of material and devices, including two-dimensional materials, semiconductor materials and devices, quantum materials, Li-metal battery and soft materials. Dr. Ranjan received PhD from the Singapore University of Technology and Design. He subsequently joined Chalmers University of Technology, Gothenburg, Sweden as a postdoctoral researcher and currently holds a joint visiting researcher position involving the Department of Physics and Astronomy at Chalmers University of Technology and the Department of Physics at the University of Gothenburg.