Johan Piscator
Visar 30 publikationer
Hole emission mechanism in Ge/Si quantum dots
Spatial variarion of hole eigen energies in Ge/Si quantum wells
Charging Phenomena at the Interface Between High-k Dielectrics and SiOx Interlayers (Invited)
Spatial variations of hole eigen energies in Ge/Si quantum wells
The conductance method in a bottom-up approach applied on hafnium oxide/silicon interfaces
Multiparameter admittance spectroscopy for metal-oxide-semiconductor systems
Comprehensive study of InAs/GaAs quantum dots by means of complementary methods
Influence of Electron Charge States in Nanoelectronic Building Blocks
Charging phenomena at the interface between high-k dielectrics and SiOx interlayers
Scaling potential and MOSFET integration of thermally stable Gd silicate dielectrics
Comprehensive study of InAs/GaAs quantum dots by means of complementary methods
Interface Defects in HfO2, LaSiOx, and Gd2O3 High-k/MetalGate Structures on Silicon
High-k-oxide/silicon interfaces characterized by capacitance frequency spectroscopy
Schottky barriers on silicon nanowires influenced by charge configuration
A new mechanism for modulation of Schottky barrier heights on silicon nanowires
Multiphonon capture of electrons at high-k-silicon interfaces
Gd silicate: A high-k dielectric compatible with high temperature annealing
A generalised methodology for oxide leakage current metric
Electron traps at HfO2/SiOx interfaces
Schottky barrier modulation on silicon nanowires
A new mechanism for modulation of Schottky barrier heights on silicon nanowires
Schottky barrier lowering on silicon nanowires by introduction of positive charge
High-k-oxide/silicon interfaces characterized by capacitance frequency spectroscopy
Applications of SOI materials to quantum devices and Microsystems
Electron capture cross sections of InAs/GaAs quantum dots
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