Zonghe Lai
Visar 60 publikationer
Effect of Buffer Quality on the Performance of InAs/AlSb Heterostructure Backward Tunneling Diode
Effect of bismuth on InAs films grown on GaAs substrates by MBE
High quality strain-compensated multiple InAs/AlGaNAs quantum dot layers grown by MBE
Molecular beam epitaxy growth of InSb1-xBix thin films
Evaluation of microstructural development in electron beam melted Ti-6Al-4V
Investigation of metamorphic InGaAs quantum wells using N-incorporated buffer on GaAs grown by MBE
Enhancement of optical quality in metamorphic quantum wells using dilute nitride buffers
The influence of aging and annealing on the properties of Nb/Al-AlOx/Nb tunnel junctions
Threading Dislocation Blocking by Dilute Nitrides in Metamorphic Structures on GaAs Grown by MBE
Metamorphic InGaAs Materials and Telecom Lasers
Influence of Doping on Structural Properties of Graded InGaAs Layers Grown by MBE
Electron traps at HfO2/SiOx interfaces
Metamorphic growth of 1.25 – 1.29 µm InGaAs quantum well lasers by molecular beam epitaxy
Manipulation of strain relaxation in metamorphic heterostructures
1.58 µm InGaAs quantum well laser on GaAs
Reliability Investigation for Encapsulated Isotropic Conductive Adhesives Flip Chip Interconnection
Design for Embedded Chinese Display Smart Card
Determination of Mason-Coffin equation for Sn-Zn based lead-free solder joint
Interfacial adhesion of anisotropic conductive adhesives on polyimide substrate
Comparison of isothermal mechanical fatigue properties of lead-free solder joints and bulk solders
Reliability Investigation for Encapsulated Isotropic Conductive Adhesives Flip Chip Interconnection
Isothermal Low Cycle Fatigue Behavior of Single Shear Sn-9Zn and Sn-8Zn-3Bi Solder Joint
Comparison of isothermal mechanical fatigue properties of lead-free solder joints and bulk solders
Thermal Fatigue Cracking of Surface Mount Conductive Adhesive Joints
Effect of Curing Condition of Adhesion Strength and ACA Flip Chip Contact Resistance
Reliability Investigation for Encapsulated Isotropic Conductive Adhesives Flip Chip Interconnection
Process Development and Reliability for System-in-a-Package Using Liquid Crystal Polymer Substrate
Microstructure Investigation of Sn-Ag-Based Lead-Free Solder Joints by Electron Microscopy
Electrical Characterization of Isotropic Conductive Adhesive under Mechanical Deformation
Reliability of ACA flip-chip joints on FR-4 substrate
Low Cycle fatigue of lead-free solders
Comparison of Mechanical Fatigue Test and Thermal Cycling for Failure Analysis of Solder Joints
Microstructure investigation of Sn-0.5Cu-3.5Ag and Sn-3.5Ag-0.5Cu-0.5B Lead Free Solders
Low-Cycle fatigue life of SnAgBi and Sn-Ag lead-free solders
Fatigue properties of lead-free solders
Microstructural coarsening of lead-free solders
Bump Height Effect on the Reliability and on the Strains Variations of ACA Flip-chip Joints
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